SMTPA68 查看數據表（PDF） - Galaxy Semi-Conductor

零件编号

产品描述 (功能)

生产厂家

SMTPA68

TELECOMMUNICATION PROTECTION

Galaxy Semi-Conductor 

RATINGS AND CHARACTERISTIC CURVES

SMTPAxxx

TEST CIRCUIT 1 FOR DYNAMIC IBO AND VBO PARAMETERS:

100V/μs, di/dt<10A/μs, Ipp=50A

2Ω

U

10μF

45Ω

66Ω47Ω

83Ω 46μH

0.36nF

KEY TEK 'SYSTEM 2' GENERATOR WITH PN2461 MODULE

1kV/μs, di/dt<10A/μs, Ipp=10A

26μH

U

60μF

12Ω

250Ω

47Ω 46μH

KEY TEK 'SYSTEM 2' GENERATOR WITH PN2461 MODULE

TEST CIRCUIT 2 FOR IBO AND VBO PARAMETERS:

tp =2 0m s

k

Vout

I BO

measurement

1/4

R1

140

R2

240

D.U.T

VBO

measurement

TEST PROCEDURE :

Pulse Test duration (tp = 20ms):

- For Bidirectional devices = Sw itch K is closed

- For Unidirectional devices = Sw itch K is open.

VOUT Selection

- Device w ith VBO < 200 Volt

- VOUT = 250 VRMS, R1 = 140 Ω.

- Device w ith VBO 200 Volt

- VOUT = 480 VRMS, R2 = 240Ω.

www.galaxycn.com

Document Number 0286002

BLGALAXY ELECTRICAL

3.

Share Link: