ZTL431AFFTA(2007) 查看數據表（PDF） - Zetex => Diodes

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ZTL431AFFTA
(Rev.:2007)

Cost effective adjustable precision shunt regulator

Zetex => Diodes 

DC test circuits

IL

VKA

IKA

IREF

VREF

ZTL431, ZTL432

IL

IREF

VKA

IKA

VREF

VKA

IKA(OFF)

Figure 1 Test circuit for

VKA = VREF

Figure 2 Test circuit for

VKA > VREF

Notes

Deviation of reference input voltage, Vdev, is

defined as the maximum variation of the

reference input voltage over the full

temperature range.

The average temperature coefficient of the

reference input voltage, Vref is defined as:

VREF(ppm°C)

=

V-----D---E---V-----×-----1---,---0---0----0---,---0---0----0-

VREF(T1 – T2)

The dynamic output impedance, Rz, is

defined as:

Rz

=

Δ-----V----z

ΔIz

When the device is programmed with two

external resistors, R1 and R2, (fig 2), the

dynamic output impedance of the overall

circuit, R'z, is defined as:

R'z = Rz⎝⎛1 + RR-----12--⎠⎞

Stability boundary

The ZTL431 and ZTL432 are stable with a

range of capacitive loads. A zone of instability

exists as demonstrated in the typical

characteristic graph on page 5. The graph

shows typical conditions. To ensure reliable

stability a capacitor of 4.7nF or greater is

recommended between anode and cathode.

Issue 8 - April 2007

7

© Zetex Semiconductors plc 2007

Figure 3 Test circuit for

off state current

www.zetex.com

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