AD5320 查看數據表（PDF） - Analog Devices

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AD5320

+2.7 V to +5.5 V, 140
A, Rail-to-Rail Output 12-Bit DAC in a SOT-23

Analog Devices 

AD5320

TERMINOLOGY

Relative Accuracy

For the DAC, relative accuracy or Integral Nonlinearity (INL)

is a measure of the maximum deviation, in LSBs, from a straight

line passing through the endpoints of the DAC transfer func-

tion. A typical INL vs. code plot can be seen in Figure 2.

Differential Nonlinearity

Differential Nonlinearity (DNL) is the difference between the

measured change and the ideal 1 LSB change between any two

adjacent codes. A specified differential nonlinearity of ± 1 LSB

maximum ensures monotonicity. This DAC is guaranteed

monotonic by design. A typical DNL vs. code plot can be seen

in Figure 3.

Zero-Code Error

Zero-code error is a measure of the output error when zero code

(000 Hex) is loaded to the DAC register. Ideally the output

should be 0 V. The zero-code error is always positive in the

AD5320 because the output of the DAC cannot go below 0 V.

It is due to a combination of the offset errors in the DAC and

output amplifier. Zero-code error is expressed in mV. A plot of

zero-code error vs. temperature can be seen in Figure 6.

Full-Scale Error

Full-scale error is a measure of the output error when full-scale

code (FFF Hex) is loaded to the DAC register. Ideally the

output should be VDD – 1 LSB. Full-scale error is expressed in

percent of full-scale range. A plot of full-scale error vs. tempera-

ture can be seen in Figure 6.

Gain Error

This is a measure of the span error of the DAC. It is the devia-

tion in slope of the DAC transfer characteristic from ideal

expressed as a percent of the full-scale range.

Total Unadjusted Error

Total Unadjusted Error (TUE) is a measure of the output error

taking all the various errors into account. A typical TUE vs.

code plot can be seen in Figure 4.

Zero-Code Error Drift

This is a measure of the change in zero-code error with a

change in temperature. It is expressed in µV/°C.

Gain Error Drift

This is a measure of the change in gain error with changes in

temperature. It is expressed in (ppm of full-scale range)/°C.

Digital-to-Analog Glitch Impulse

Digital-to-analog glitch impulse is the impulse injected into the

analog output when the input code in the DAC register changes

state. It is normally specified as the area of the glitch in nV secs

and is measured when the digital input code is changed by

1 LSB at the major carry transition (7FF Hex to 800 Hex). See

Figure 19.

Digital Feedthrough

Digital feedthrough is a measure of the impulse injected into the

analog output of the DAC from the digital inputs of the DAC

but is measured when the DAC output is not updated. It is

specified in nV secs and measured with a full-scale code

change on the data bus, i.e., from all 0s to all 1s and vice versa.

REV. B

–5–

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