79L12A 查看數據表（PDF） - Estek Electronics Co. Ltd

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79L12A

fixed-voltage monolithic integrated-circuit voltage regulators is designed for a wide range of applications

Estek Electronics Co. Ltd 

79LXX

Electrical Characteristics 79L18A

Electrical characteristics at specified virtual junction temperature, V I= -26V,IO = 40mA (unless otherwise noted)

Parameter

Output voltage**

Test conditions*

25° C

Min

-17.3

79L18A

Typ

-18

Input regulation

IO= 1mA to 40mA,

VI= -20.5V to -33V

IO= 1mA to 70mA

VI= -20.5V to -33V

VI= -21V to -33V

0° C to 125° C

-17.1

25° C

-17.1

70

60

Ripple rejection

VI= -23V to -33V, f= 120Hz

0° C to 125° C

33

48

Output regulation

IO= 1mA to 100mA

IO= 1mA to 40mA

25° C

27

19

Max

-18.7

-18.9

-18.9

325

275

170

85

Units

V

mV

dB

mV

Output noise voltage

Dropout voltage

f= 10Hz to 100 KHz

25° C

25° C

150

µV

1.7

V

Bias current

Bias current change

VI= -21V to -33V

IO= 1mA to 40mA

25° C

125° C

0° C to 125° C

6.5

mA

6

1.5

0.1

* Pulse testing techniques are used to maintain the junction temperature as close to the ambient temperature as possible. Thermal

effects must be taken into account separately. All characteristics are measured with a 0.33µF capacitor across the input and a 0.1 µF

capacitor across the output.

** This specification applies only for dc power dissipation permitted by absolute maximum ratings.

Electrical Characteristics 79L24A

Electrical characteristics at specified virtual junction temperature, V I= -33V,IO = 40mA (unless otherwise noted)

Parameter

Output voltage**

Test conditions*

25° C

79L24A

Min

Typ

-23

-24

Input regulation

IO= 1mA to 40mA, VI= -27V to -38V

IO= 1mA to 70mA

VI= -27V to -38V

VI= -28V to -38V

0° C to 125° C

25° C

-22.8

-22.8

90

75

Ripple rejection

VI= -29V to -35V, f= 120Hz

0° C to 125° C

31

47

Output regulation

IO= 1mA to 100mA

IO= 1mA to 40mA

25° C

40

25

Max

-25

-25.2

-25.2

350

300

200

100

Units

V

mV

dB

mV

Output noise voltage

Dropout voltage

f= 10Hz to 100 KHz

25° C

25° C

200

µV

1.7

V

Bias current

Bias current change

VI= -28V to -38V

IO= 1mA to 40mA

25° C

125° C

0° C to 125° C

6.5

mA

6

1.5

0.1

* Pulse testing techniques are used to maintain the junction temperature as close to the ambient temperature as possible. Thermal

effects must be taken into account separatel y. All characteristics are measured with a 0.33µF capacitor across the input an d a 0.1 µF

capacitor across the output.

** This specification applies only for dc power dissipation permitted by absolute maximum ratings.

BEIJING ESTEK ELECTRONICS CO.,LTD

5

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