M29F512B 查看數據表（PDF） - STMicroelectronics

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M29F512B

512 Kbit (64Kb x8, Bulk) Single Supply Flash Memory

STMicroelectronics 

M29F512B

Table 7. AC Measurement Conditions

Load Capacitance (CL)

30pF

Input Rise and Fall Times

≤ 10ns

Input Pulse Voltages

0 to 3V

Input and Output Timing Ref. Voltages

1.5V

Figure 5. AC Testing Input Output Waveform

3V

1.5V

0V

AI01417

Figure 6. AC Testing Load Circuit

1.3V

1N914

DEVICE

UNDER

TEST

3.3kΩ

OUT

CL = 30pF

CL includes JIG capacitance

AI02979

Table 8. Capacitance

(TA = 25 °C, f = 1 MHz)

Symbol

Parameter

CIN

Input Capacitance

COUT

Output Capacitance

Note: Sampled only, not 100% tested.

Test Condition

VIN = 0V

VOUT = 0V

Min

Max

Unit

6

pF

12

pF

8/16

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