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LB11970FV(2013) 查看數據表(PDF) - ON Semiconductor

零件编号
产品描述 (功能)
生产厂家
LB11970FV
(Rev.:2013)
ON-Semiconductor
ON Semiconductor ON-Semiconductor
LB11970FV Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
Ordering number : ENA0707
LB11970FV
Monolithic Digital IC
For Fan Motor
Single-phase Full-wave Driver
http://onsemi.com
Overview
The LB11970FV is a single-phase full-wave driver for fan motor.
Functions
Single-phase full-wave drive (16V to 1.2A output transistor incorporated)
Variable speed function using thermistor input and external signal incorporated
Enables silent and low-vibration variable speed control through direct PWM control with separately-excited upper
Tr
Current limiter circuit (limit at IO=480mA with RL=1Ω connection, the limiter value determined with Rf)
Kick-back absorption circuit incorporated
Low-consumption, low-loss, and low-noise drive enabled by the soft switching circuit during phase shift
Regeneration Di incorporated with less external parts
HB incorporated
Lock protection and automatic reset functions incorporated
FG (rotation detection) output
Thermal shutdown circuit incorporated
Specifications
Absolute Maximum Ratings at Ta = 25°C
Parameter
Symbol
VCC maximum supply voltage
VM maximum supply voltage
VCC max
VM max
OUT pin maximum output current
OUT pin output withstand voltage
HB maximum output current
IOUT max
VOUT max
HB
VTH, RMI input pin withstand voltage
VTH RMI max
P-IN input pin withstand voltage
VP-IN max
FG output pin output withstand voltage
VFG max
FG output current
IFG max
Allowable power dissipation
Pd max
Operating temperature range
Topr
Storage temperature range
Tstg
* Specified substrate: 30mm×30mm×0.8mm, paper phenol.
Conditions
Specified substrate *
Ratings
Unit
17
V
17
V
1.2
A
18
V
10 mA
7
V
VCC
V
18
V
10 mA
0.8
W
-30 to 90
°C
-55 to 150
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
May, 2013
30707 MS IM B8-8588, B8-8433 No.A0707-1/7

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