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RH1013M 查看數據表(PDF) - Linear Technology

零件编号
产品描述 (功能)
生产厂家
RH1013M
Linear
Linear Technology Linear
RH1013M Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
RH1013M
TABLE 1A: ELECTRICAL CHARACTERISTICS (Postirradiation)
VS = ±15V, VCM = 0V, TA = 25°C, unless otherwise noted.
SYMBOL PARAMETER
CONDITIONS
10KRAD(Si) 20KRAD(Si) 50KRAD(Si) 100KRAD(Si) 200KRAD(Si)
NOTES MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX UNITS
VOS
Input Ofset Voltage
450
450
600
750
900 µV
2
600
600
750
900
µV
IOS
Input Offset Current
10
10
15
20
25
nA
2
10
10
15
20
nA
IB
Input Bias Current
60
75
100
175
250 nA
2
80
100
125
200
nA
Input Voltage Range
1 13.5
13.5
13.5
13.5
13.5
V
1 –15.0
–15.0
– 15.0
– 15.0
–15.0
V
2 3.5
3.5
3.5
3.5
V
2
0
0
0
0
V
CMRR Common-Mode Rejection VCM = 13V, – 15V
Ratio
97
97
94
90
86
dB
PSRR Power Supply Rejection VS = ± 5V to ±18V
Ratio
100
98
94
86
80
dB
AVOL Large-Signal Voltage Gain RL 10k, V O = ±10V
VOUT Maximum Output Voltage RL 10k
Swing
Output Low, No Load
500
±12.5
2
200
±12.5
25
100
±12.5
30
50
±12.5
40
25
±12.5
50
V/mV
V
mV
Output Low, 600 to GND 2
10
10
10
10
mV
Output Low, ISINK = 1mA
2
0.6
0.8
1.0
1.6
V
Output High, No Load
2 4.0
4.0
4.0
4.0
V
Output High, 600 to GND 2 3.4
3.2
3.0
2.8
V
SR
Slew Rate
IS
Supply Current
RL 10k
Per Amplifier
0.13
0.12
0.11
0.55
0.55
2
0.50
0.50
0.07
0.55
0.50
0.01
0.55
0.50
V/µs
0.55 mA
mA
Note 1: Guaranteed by design, characterization, or correlation to other
tested parameters..
Note 2: Specification applies for VS+ = 5V, VS– = 0V, VCM = 0V,
VOUT = 1.4V.
TABLE 2: ELECTRICAL TEST REQUIRE E TS
MIL-STD-883 TEST REQUIREMENTS
Final Electrical Test Requirements (Method 5004)
Group A Test Requirements (Method 5005)
Group B and D for Class S, and
Group C and D for Class B
End Point Electrical Parameters (Method 5005)
* PDA applies to subgroup 1. See PDA Test Notes.
SUBGROUP
1*,2,3,4,5,6
1,2,3,4,5,6
1,2,3
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown as the final electrical test in accordance with method
5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after
burn-in divided by the total number of devices submitted for burn-in in
that lot shall be used to determine the percent for the lot.
Linear Technology Corporation reserves the right to test to tighter limits
than those given.
3

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