3554 查看數據表（PDF） - M.S. Kennedy Corporation
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3554 Datasheet PDF : 5 Pages
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ABSOLUTE MAXIMUM RATINGS
±VCC
Supply Voltage ±18V ○
○
○
○
○
○
○
○
○
○
○
○
○
○
TST
Storage Temperature Range -65°C to +150°C
IOUT
Peak Output Current ○ ○ ○ ○ ○ ○ ○ ○ ±150mA TLD Lead Temperature Range○ ○ ○ ○ ○ ○ ○ ○ ○ ○ 300°C
VIN
Differential Input Voltage ○
○
○
○
○
○
○
±25V
○
(10 Seconds)
TC
Case Operating Temperature
PD
Power Dissipation ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ See Curve
MSK 3554B ○ ○ ○ ○ ○ ○ ○ -55°C to +125°C TJ
Junction Temperature ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ 175°C
MSK 3554 ○ ○ ○ ○ ○ ○ ○ ○ -40°C to +85°C
ELECTRICAL SPECIFICATIONS
Parameter
Test Conditions
Group A
MSK 3554B
MSK 3554
Subgroup Min. Typ. Max. Min. Typ. Max.
Units
STATIC
Supply Voltage Range 3
Quiescent Current
VIN=0V
-
±12 ±15 ±18 ±12 ±15 ±18
V
1
-
±14 ±20 -
±14 ±20 mA
AV=-1V/V
2,3
-
-
±30 -
-
-
mA
Thermal Resistance 3
Junction to Case Output Devices
-
-
37
-
-
37
-
°C/W
INPUT
Input Offset Voltage
Bal.Pins=N/C VIN=0V AV=-10V/V
1
- ±0.5 ±2.0 - ±0.5 ±3.0 mV
Input Offset Voltage Drift
VIN=0V
2,3
-
±20 ±50 -
±20
- µV/°C
Input Offset Adjust 3
RPOT=20KΩ To +VCC AV=-1V/V
1,2,3
Adjust to Zero
Adjust to Zero
mV
Input Bias Current 10
VCM=0V Either Input
1
-
±10 ±50 -
±20 ±100 pA
2,3
-
±10 ±50 -
-
-
nA
Input Offset Current
VCM=0V
1
- ±2.0 ±25 - ±2.0 ±30 pA
Input Impedance 3
F=DC Differential
2,3
- ±2.0 ±30 -
-
-
nA
-
-
1011
-
-
10 11
-
Ω
Power Supply Rejection Ratio 3
∆ VCC=10V
-
80 110
-
80 110
-
dB
Input Noise Density 3
F=1KHz
-
-
15
-
-
15
- nV√Hz
Input Noise Voltage 3
F=10Hz To 1MHz
-
-
10.0
-
-
10.0
- µVrms
OUTPUT
Output Voltage Swing
RL=100Ω
4 ±10.5 ±12
- ±10 ±12
-
V
Output Current
TJ<150°C
4
±100 ±120 - ±100 ±120
-
mA
Settling Time 2 3
0.1% 10V step
4
-
120 150 -
120 150
nS
Power Bandwidth 3
RL=100Ω VO=±10V CC=0
4
16
19
-
15
19
-
MHz
Bandwidth (Small Signal) 3
CC=0
4
70
90
-
70
90
-
MHz
TRANSFER CHARACTERISTICS
Slew Rate
VOUT=±10V RL=100Ω CC=0
4
800 1200
- 750 1200
-
V/µS
Open Loop Voltage Gain 3 CC=0 RL=100Ω F=1KHz VOUT=±10V
4
90
96
-
88
96
-
dB
NOTES:
1 Unless otherwise specified ±VCC=±15VDC
2 AV=-1, measured in false summing junction circuit.
3 Devices shall be capable of meeting the parameter, but need not be tested. Typical parameters are for reference only.
4 Industrial grade devices shall be tested to subgroups 1 and 4 unless otherwise specified.
5 Military grade devices ('B' suffix) shall be 100% tested to subgroups 1,2,3 and 4.
6 Subgroup 5 and 6 testing available upon request.
7 Subgroup 1,4
TA=TC=+25°C
8 Subgroup 2,5
TA=TC=+125°C
9 Subgroup 3,6
TA=TC=-55°C
10 Measurement taken .5 second after application of power using automatic test equipment.
2
Rev. B 7/00
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