NTE3880 查看數據表（PDF） - NTE Electronics

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NTE3880

Integrated Circuit NMOS, 8–Bit Microprocessor (MPU), 4MHz

NTE Electronics 

Absolute Maximum Ratings:

Temperature Under Bias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0° to +70°C

Storage Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65° to +150°C

Voltage On Any Pin With Respect to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3V to +7V

Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.5W

Note 1. Stresses above those listed under “Absolute Maximum Ratings” may cause permanent

damage to the device. This is a stress rating only functional operation of the device at these

or any other condition above those indicated in the operational sections of this specification

is not implied. Exposure to absolute maximum rating conditions for extended periods may

affect device reliability.

DC Characteristics: (TA = 0° to 70°C, VCC = 5V ±5% unless otherwise specified)

Parameter

Symbol

Test Conditions

Min Typ Max Unit

Clock Input Low Voltage

Clock Input High Voltage

Input Low Voltage

Input High Voltage

Output Low Voltage

Output High Voltage

Power Supply Current

Input Leakage Current

Tri–State Output Leakage Current in Float

Tri–State Output Leakage Current in Float

Data Bus Leakage Current in Input Mode

VILC

VIHC

VIL

VIH

VOL

VOH

ICC

IL1

ILOH

ILOL

ILD

IOL = 1.8mA

IOH = –250µA

VIN = 0 to VCC

VOUT = 2.4 to VCC

VOUT = 0.4V

0 ≤ VIN ≤ VCC

–0.3 – 0.80 V

VCC–0.6 – VCC+3 V

–0.3 – 0.8 V

2.0

– VCC V

–

– 0.4 V

2.4

–

–

V

–

90 200 mA

–

–

10 µA

–

–

10 µA

–

– –10 µA

–

– ±10 µA

Capacitance: (TA = +25°C, f = 1MHz, unmeasured pins to GND unless otherwise specified)

Parameter

Symbol

Test Conditions

Min Typ Max Unit

Clock Capacitance

Input Capacitance

Output Capacitance

Cφ

CIN

COUT

– – 35 pF

––

5 pF

– – 10 pF

AC Characteristics: (TA = 0°C to +70°C, VCC = +15V ± 5% unless otherwise specified)

Parameter

Symbol Signal Test Conditions Min Typ Max Unit

Clock Period

Clock Pulse Width, Clock High

Clock Pulse Width, Clock Low

Clock Rise and Fall Time

Address Output Delay

Data to Float

Address Stable Prior to MRFQ (Memory Cycle)

Address Stable Prior to IOFQ, RD or WR (I/O Cycle)

Address Stable from RD, WR, IORQ, or MREQ

Address Stable from RD or WR During Float

tc

tw (φH)

tw (φL)

tr, tf

tD (AD)

tF (AD)

tacm

taci

tca

tcaf

φ

A0–15 CL = 50pF

25 – Note 2 µs

110 – Note 3 ns

110 – 2000 ns

–

– 30 ns

–

– 110 ns

–

– 90 ns

Note 4 –

–

ns

Note 5 –

–

ns

Note 6 –

–

ns

Note 7 –

–

ns

Note 2. tc = tw (φH) + tw (φL) + tr + tf.

Note 3. Although static by design, testing guarantees tw (φH) of 200µs maximum.

Note 4. tacm = tw (φH) + tf–65.

Note 5. taci = tc–70.

Note 6. tca = tw (φL) + tr–50.

Note 7. tcaf = tw (φL) + tr–45.

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