HEF4585BP(2009) 查看數據表（PDF） - NXP Semiconductors.
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HEF4585BP Datasheet PDF : 15 Pages
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NXP Semiconductors
12. Waveforms
HEF4585B
4-bit magnitude comparator
Vl
An, Bn, In
input
0V
VOH
Qn output
VOL
VM
tPLH(1)
VM
10%
90%
tt
tPHL(2)
tt
001aak300
Measurement points shown in Table 9
(1) Qn (QA>B, QA<B and QA=B) LOW to HIGH (tPLH) transitions triggered by An, Bn or IA<B, IA>B and IA=B as shown by Table 3.
(2) Qn (QA>B, QA<B and QA=B) HIGH to LOW (tPHL) transitions triggered by An, Bn or IA<B, IA>B and IA=B as shown by Table 3.
Fig 4. Waveforms showing switching times
a. Input waveforms
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
001aaj781
VDD
VI
G
VO
DUT
RT
CL
001aag182
b. Test circuit
Fig 5.
Test data is given in Table 9.
Definitions for test circuit:
DUT = Device Under Test
CL = Load capacitance including jig and probe capacitance;
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
Test circuit for measuring switching times
HEF4585B_4
Product data sheet
Rev. 04 — 10 August 2009
© NXP B.V. 2009. All rights reserved.
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