4585B 查看數據表（PDF） - NXP Semiconductors.
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4585B Datasheet PDF : 16 Pages
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NXP Semiconductors
11. Waveforms
HEF4585B
4-bit magnitude comparator
Vl
An, Bn, In
input
0V
VOH
Qn output
VOL
VM
tPLH(1)
VM
10%
90%
tt
tPHL(2)
tt
001aak300
Measurement points shown in Table 9
(1) Qn (QA>B, QA<B and QA=B) LOW to HIGH (tPLH) transitions triggered by An, Bn or IA<B, IA>B and IA=B as shown by Table 3.
(2) Qn (QA>B, QA<B and QA=B) HIGH to LOW (tPHL) transitions triggered by An, Bn or IA<B, IA>B and IA=B as shown by Table 3.
Fig 4. Waveforms showing switching times
a. Input waveforms
VI
negative
pulse
0V
VI
positive
pulse
0V
90 %
10 %
VM
10 %
tf
tr
90 %
VM
tW
90 %
VM
10 %
tr
tf
90 %
VM
10 %
tW
001aaj781
VDD
VI
G
VO
DUT
RT
CL
001aag182
b. Test circuit
Fig 5.
Test data is given in Table 9.
Definitions for test circuit:
DUT = Device Under Test
CL = Load capacitance including jig and probe capacitance;
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
Test circuit for measuring switching times
HEF4585B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 6 — 21 November 2011
© NXP B.V. 2011. All rights reserved.
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