LTC2983I 查看數據表（PDF） - Linear Technology
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LTC2983I Datasheet PDF : 72 Pages
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LTC2983
Digital Inputs and Digital Outputs The l denotes the specifications which apply over the
full operating temperature range, otherwise specifications are at TA = 25°C.
SYMBOL PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
External SCK Frequency Range
l
0
2
MHz
External SCK LOW Period
l
250
ns
External SCK HIGH Period
l
250
ns
t1
CS↓ to SDO Valid
t2
CS↑ to SDO Hi-Z
t3
CS↓ to SCK↑
t4
SCK↓ to SDO Valid
t5
SDO Hold After SCK↓
t6
SDI Setup Before SCK↑
t7
SDI HOLD After SCK↑
High Level Input Voltage
Low Level Input Voltage
CS, SDI, SCK, RESET
CS, SDI, SCK, RESET
l
0
l
0
l
100
l
l
10
l
100
l
100
l VDD – 0.5
l
200
ns
200
ns
ns
225
ns
ns
ns
ns
V
0.5
V
Digital Input Current
CS, SDI, SCK, RESET
l
–10
10
µA
Digital Input Capacitance
CS, SDI, SCK, RESET
10
pF
LOW Level Output Voltage (SDO, INTERRUPT)
High Level Output Voltage (SDO, INTERRUPT)
Hi-Z Output Leakage (SDO)
IO = –800µA
IO = 1.6mA
l
l VDD – 0.5
l
–10
0.4
V
V
10
µA
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: All voltage values are with respect to GND.
Note 3: Full scale ADC error. Measurements do not include reference error.
Note 4: Guaranteed by design, not subject to test.
Note 5: The output noise includes the contribution of internal calibration
operations.
Note 6: MUX configuration delay = default 1ms
Note 7: Global configuration set to 60Hz rejection.
Note 8: Global configuration set to 50Hz rejection.
Note 9: Global configuration default 50Hz/60Hz rejection.
Note 10: The exact value of VREF is stored in the LTC2983 and used
for all measurement calculations. Temperature coefficient is measured
by dividing the maximum change in output voltage by the specified
temperature range.
Note 11: Analog power-up. Command status register inaccessible during
this time.
Note 12: Digital initialization. Begins at the conclusion of Analog Power-
Up. Command status register is 0 × 80 at the beginning of digital
initialization and 0 × 40 at the conclusion.
Note 13: Long-term stability typically has a logarithmic characteristic
and therefore, changes after 1000 hours tend to be much smaller than
before that time. Total drift in the second thousand hours is normally less
than one third that of the first thousand hours with a continuing trend
toward reduced drift with time. Long-term stability will also be affected by
differential stresses between the IC and the board material created during
board assembly.
Note 14: Hysteresis in output voltage is created by package stress
that differs depending on whether the IC was previously at a higher or
lower temperature. Output voltage is always measured at 25°C, but
the IC is cycled to the hot or cold temperature limit before successive
measurements. Hysteresis measures the maximum output change for the
averages of three hot or cold temperature cycles. For instruments that
are stored at well controlled temperatures (within 20 or 30 degrees of
operational temperature), it is usually not a dominant error source. Typical
hysteresis is the worst-case of 25°C to cold to 25°C or 25°C to hot to
25°C, preconditioned by one thermal cycle.
Note 15: Differential Input Range is ±VREF/2.
Note 16:RTD and thermistor measurements are made ratiometrically.
As a result current source excitation variation does not affect absolute
accuracy. Choose an excitation current such that largest sensor or RSENSE
resistance value, when driven by the nominal excitation current, will drop
1V or less. The extended ADC input range will accommodate variation in
excitation current and the ratiometric calculation will negate the absolute
value of the excitation current.
Note 17: Do not apply voltage or current sources to these pins. They must
be connected to capacitive loads only, otherwise permanent damage may
occur.
Note 18: Input leakage measured with VIN = –10mV and VIN = 2.5V.
For more information www.linear.com/LTC2983
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