NTE21128 查看數據表（PDF） - NTE Electronics

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NTE21128

Integrated Circuit NMOS, 128K (16K x 8) UV EPROM

NTE Electronics 

NTE21128

Integrated Circuit

NMOS, 128K (16K x 8) UV EPROM

Description:

The NTE21128 is a 131,072 bit UV erasable and electrically programmable memory EPROM in a

28–Lead DIP type package organized as 16,384 words by 8 bits. The transparent lid allows the user

to expose the chip to ultraviolet light to erase the bit pattern. A new pattern can then be written to the

device by following the programming procedure.

Features:

D Access Time: 250ns

D Single 5V Supply Voltage

D Low Standby Current: 40mA Max

D TTL Compatible During Read and Program

D Fast Programming Algorithm

D Programming Voltage: 12V Typ

Absolute Maximum Ratings:

Supply Voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.6V to 6.25V

Program Supply, VPP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.6V to 14V

A9 Voltage, VA9 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.6V to 13.5V

Input or Output Voltages, VIO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.6V to 6.25V

Ambient Operating Temperature, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0° to +70°C

Temperature Under Bias, TBIAS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –10° to +80°C

Storage Temperature Range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65° to +125°C

Note 1. Except for the rating “Operating Temperature Range”, stresses above those listed in the

table “Absolute Maximum Ratings” may cause permanent damage to the device. These are

stress ratings only and operation of the device at these or any other conditions above those

indicated in the Operating sections of this specification is not implied. Exposure to Absolute

Maximum Rating conditions for extended periods may affect device reliability.

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