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STP16CPC26TTR 查看數據表(PDF) - STMicroelectronics

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STP16CPC26TTR Datasheet PDF : 28 Pages
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STP16CPC26
Typical test circuits
7
Typical test circuits
Figure 8: "Typical test circuit for electrical characteristics" and Figure 9: "Typical test circuit
for switching characteristics" show respectively the typical test circuit used measuring
electrical (e.g. input voltage high/low level, output leakage current, supply current, etc.) and
switching characteristics (propagation delays, set-up and hold time, rise and fall time of
VOUT, etc.). The resistor RL and capacitor CL in parallel connected to each output in Figure
8: "Typical test circuit for electrical characteristics" simulate a LED behavior.
Figure 8: Typical test circuit for electrical characteristics
Figure 9: Typical test circuit for switching characteristics
DocID18469 Rev 6
11/28

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