NCS37012MNTWG 查看數據表（PDF） - ON Semiconductor

零件编号

产品描述 (功能)

生产厂家

NCS37012MNTWG

Self Test Ground Fault Circuit Interrupter (GFCI)

ON Semiconductor 

NCS37012

Setting Grounded − Neutral Response Time

Cgn is used to define the response time of the

grounded−neutral detection circuit. The analog portion

converts the impedance into a DC voltage and a high

frequency (aliased) component. The capacitor is used to

remove the high frequency component leaving just the DC

representation of the impedance.

CTcapGN= 1.8E-4/CTresGN

Self Test

Automatic self test will occur every 17 minutes. If a

failure is observed it will be retested every second until it

passes. If it fails 8 successive tests then the GFCI will

indicate that it has failed self test. See the LED and speaker

functions table to see the different self test indicators. If

TripEN is asserted high the GFCI unit will trip.

Differential ground fault test – tests the CT and the

internal differential detection signal path by asserting the

GFtest output high for 2 half cycles. The test will pass if a

6-8 mA differential current is enabled during these two half

waves. Greater than 20 mA current during this test will cause

a fault to be detected.

Ground neutral fault test – tests the internal ground neutral

stimulus and detection paths by enabling an internal 50k

resistor between the CTstim and CTbias pins. If the resistor

and capacitor on CTresGN are connected this will pass the

GN self test.

PTT

When the PTT input pin is de-asserted for greater than

80 ms a self test will be performed. If this test is successful

the SCR will be fired which will trip the GFCI unit. If the test

is unsuccessful the LED[0] pin will flash indicating a failure.

http://onsemi.com

7

Share Link: