74ABT00DB 查看數據表（PDF） - NXP Semiconductors.
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74ABT00DB Datasheet PDF : 12 Pages
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Nexperia
74ABT00
Quad 2-input NAND gate
9. Static characteristics
Table 6. Static characteristics
Symbol Parameter
Conditions
VIK
VOH
VOL
II
IOFF
ICEX
IO
ICC
ICC
CI
input clamping voltage VCC = 4.5 V; IIK = 18 mA
HIGH-level output
voltage
VCC = 4.5 V; IOH = 15 mA;
VI = VIL or VIH
LOW-level output
voltage
VCC = 4.5 V; IOL = 20 mA;
VI = VIL or VIH
input leakage current
power-off leakage
current
VCC = 5.5 V; VI = GND or 5.5 V
VCC = 0 V; VI or VO 4.5 V
output high leakage
current
HIGH-state; VO = 5.5 V;
VCC = 5.5 V; VI = GND or VCC
output current
VCC = 5.5 V; VO = 2.5 V
supply current
VCC = 5.5 V; VI = GND or VCC
additional supply
current
per input pin; VCC = 5.5 V;
one input at 3.4 V;
other inputs at VCC or GND
input capacitance
VI = 0 V or VCC
25 C
40 C to +85 C Unit
Min Typ Max Min Max
1.2 0.9 - 1.2
-V
2.5 2.9 -
2.5
-V
- 0.35 0.5
-
0.5 V
- 0.01 1.0 -
- 5.0 100 -
1.0 A
100 A
- 5.0 50
-
50 A
[1] 50 75 180 50
-
2 50
-
[2] - 0.25 500
-
180 mA
50 A
500 A
-
3
-
-
- pF
[1] Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
[2] This is the increase in supply current for each input at 3.4 V.
10. Dynamic characteristics
Table 7. Dynamic characteristics
GND = 0 V; for test circuit, see Figure 7.
Symbol Parameter
Conditions
25 C; VCC = 5.0 V
tPLH
tPHL
tsk(o)
LOW to HIGH
propagation delay
HIGH to LOW
propagation delay
output skew time
nA, nB to nY; see Figure 6
Min Typ Max
1.0 2.5 3.6
nA, nB to nY; see Figure 6
1.0 2.0 2.8
[1]
-
0.4 0.5
40 C to +85 C; Unit
VCC = 5.0 V 0.5 V
Min
Max
1.0
4.1 ns
1.0
3.4 ns
-
0.5 ns
[1] Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
74ABT00
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 11 August 2016
© Nexperia B.V. 2017. All rights reserved
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