74ABT00DB 查看數據表（PDF） - NXP Semiconductors.
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74ABT00DB Datasheet PDF : 12 Pages
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Nexperia
11. Waveforms
74ABT00
Quad 2-input NAND gate
9,
Q$Q%LQSXW
*1'
92+
Q<RXWSXW
92/
90
W3+/
90
W3/+
PQD
Fig 6.
VM = 1.5 V
VOL and VOH are typical output voltage levels that occur with the output load.
Propagation delay input (nA, nB) to output (nY) and output skew time
9,
QHJDWLYH
SXOVH
9
9,
SRVLWLYH
SXOVH
9
90
WI
WU
90
W:
90
WU
WI
90
W:
DDL
9,
*
9&&
92
'87
57
a. Input pulse definition
b. Test circuit
Fig 7.
Test data is given in Table 8.
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Test circuit for measuring switching times
9(;7
5/
&/
5/
PQD
Table 8.
Input
VI
3.0 V
Test data
fi
1 MHz
tW
500 ns
tr, tf
2.5 ns
Load
CL
50 pF
RL
500
VEXT
tPHL, tPLH
open
74ABT00
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 11 August 2016
© Nexperia B.V. 2017. All rights reserved
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