74HCT126DB,112 查看數據表（PDF） - NXP Semiconductors.

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74HCT126DB,112

IC BUFFER DVR TRI-ST QD 14SSOP

NXP Semiconductors. 

Nexperia

74HC126; 74HCT126

Quad buffer/line driver; 3-state

9, 

W:

QHJDWLYH

SXOVH

90



9

WI

9,

SRVLWLYH

SXOVH

WU



90



9

W:

90

WU

WI

90

9,

*

9&&

92

'87

57

9&&

5/ 6

&/

RSHQ

DDG

Fig 8.

Test data is given in Table 9.

Definitions test circuit:

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

CL = Load capacitance including jig and probe capacitance.

RL = Load resistance.

S1 = Test selection switch.

Test circuit for measuring switching times

Table 9. Test data

Type

Input

74HC126

74HCT126

VI

tr, tf

VCC

6 ns

3V

6 ns

Load

CL

15 pF, 50 pF

15 pF, 50 pF

RL

1 k

1 k

S1 position

tPHL, tPLH

open

open

tPZH, tPHZ

GND

GND

tPZL, tPLZ

VCC

VCC

74HC_HCT126

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 4 — 1 December 2015

© Nexperia B.V. 2017. All rights reserved

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