LM2596 查看數據表（PDF） - ON Semiconductor
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LM2596 Datasheet PDF : 25 Pages
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LM2596
Typical Application (Adjustable Output Voltage Version)
12 V
+Vin
Unregulated
DC Input
1
Cin
100 mF
Feedback
R1
LM2596
4
Output
L1
33 mH
R2
3.1k
1.0k
CFF 5.0 V Regulated
2
3 GND 5 ON/OFF
D1
1N5822
Cout
220 mF
Output 3.0 A Load
Block Diagram
Unregulated
DC Input
Cin
+Vin
1
Feedback
R2
CFF
4
R1
3.1 V Internal
Regulator
ON/OFF
ON/OFF
5
Fixed Gain
Error Amplifier Comparator
Freq
Shift
30 kHz
1.235 V
Band-Gap
Reference
150 kHz
Oscillator
Current
Limit
Latch
Reset
Driver
3.0 Amp
Switch
Thermal
Shutdown
Output
2
GND
3
L1
D1
Regulated
Output
Vout
Cout
Load
Figure 1. Typical Application and Internal Block Diagram
MAXIMUM RATINGS
Rating
Symbol
Value
Unit
Maximum Supply Voltage
ON/OFF Pin Input Voltage
Output Voltage to Ground (Steady−State)
Vin
45
V
−
−0.3 V ≤ V ≤ +Vin
V
−
−1.0
V
Power Dissipation
Case 314B and 314D (TO−220, 5−Lead)
Thermal Resistance, Junction−to−Ambient
Thermal Resistance, Junction−to−Case
Case 936A (D2PAK)
Thermal Resistance, Junction−to−Ambient
Thermal Resistance, Junction−to−Case
Storage Temperature Range
Minimum ESD Rating (Human Body Model: C = 100 pF, R = 1.5 kW)
PD
RqJA
RqJC
PD
RqJA
RqJC
Tstg
−
Internally Limited
65
5.0
Internally Limited
70
5.0
−65 to +150
2.0
W
°C/W
°C/W
W
°C/W
°C/W
°C
kV
Lead Temperature (Soldering, 10 seconds)
−
260
°C
Maximum Junction Temperature
TJ
150
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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