HEF4521B(2009) 查看數據表（PDF） - NXP Semiconductors.
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HEF4521B Datasheet PDF : 17 Pages
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NXP Semiconductors
HEF4521B
24-stage frequency divider and oscillator
a. Input waveforms
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
001aaj781
VDD
VI
G
VO
DUT
RT
CL
001aag182
b. Test circuit
Fig 6.
Test data is given in Table 10.
Definitions for test circuit:
Device Under Test (DUT);
CL = Load capacitance including jig and probe capacitance;
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
Test circuit for switching times
Table 10. Measurement points and test data
Supply voltage
Input
VI
5 V to 15 V
VDD
VM
0.5VI
tr, tf
≤ 20 ns
Load
CL
50 pF
HEF4521B_5
Product data sheet
Rev. 05 — 5 November 2009
© NXP B.V. 2009. All rights reserved.
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