DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

B43888F5226M000 查看數據表(PDF) - EPCOS AG

零件编号
产品描述 (功能)
生产厂家
B43888F5226M000
Epcos
EPCOS AG Epcos
B43888F5226M000 Datasheet PDF : 28 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
B43888
Extended useful life  105 °C
Specifications and characteristics in brief
Rated voltage VR
Surge voltage VS
Rated capacitance CR
Capacitance tolerance
Dissipation factor tan δ
(20 °C, 120 Hz)
Leakage current Ileak
(20 °C, 5 min)
Self-inductance ESL
Useful life
105 °C; VR; IAC,R
105 °C; VR; IAC,R
Requirements
Voltage endurance test
105 °C; VR
Post test requirements
Vibration resistance test
IEC climatic category
Sectional specification
160 ... 450 V DC
1.1  VR
3.3 ... 330 µF
±20%  M
VR 350 V DC: tan δ (max.) = 0.20
VR 400 V DC: tan δ (max.) = 0.24
Diameter (mm)
12.5 16
18
20
ESL (nH)
20
26
34
38
8000 h for d = 10 mm
10000 h for d 12.5 mm and VR 350 V DC
12000 h for d 12.5 mm and VR 250 V DC
C/C
tan δ
Ileak
≤ ±35% of initial value
3 times initial specified limit
initial specified limit
8000 h for d = 10 mm
10000 h for d 12.5 mm and VR 350 V DC
12000 h for d 12.5 mm and VR 250 V DC
C/C ≤ ±25% of initial value
tan δ ≤ 2 times initial specified limit
Ileak
initial specified limit
To IEC 60068-2-6, test Fc:
Displacement amplitude 1.5 mm, frequency range 10 ... 2000 Hz,
acceleration max. 20 g, duration 3 × 2 h.
Capacitor rigidly clamped by the aluminum case.
To IEC 60068-1:
VR 250 V: 40/105/56 (40 °C/+105 °C/56 days damp heat test)
VR 350 V: 25/105/56 (25 °C/+105 °C/56 days damp heat test)
IEC 60384-4
Please read Cautions and warnings and
Important notes at the end of this document.
Page 3 of 27

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]