NXP Semiconductors
Table 11. Measurement points
Supply voltage
VI(VIN)
0.9 V to 3.6 V
EN Input
VM
0.5 VI
NX3P1108
Logic controlled high-side power switch
Output
VX
0.9 VOH
VY
0.1 VOH
(1
9287
* 9,
5/
&/
Test data is given in Table 12.
Definitions test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
VEXT = External voltage for measuring switching times.
Fig 16. Test circuit for measuring switching times
Table 12. Test data
Supply voltage
VEXT
0.9 V to 3.6 V
EN Input
VI
3.3 V
9,1
9(;7
DDD
Load
CL
0.1 F
RL
500
929287
9
DDD
9,(1
9
929287
9
DDD
9,(1
9
W V
VI(VIN) = 1.8 V; CL = 0.1 F; RL = 500 .
Fig 17. Waveform showing the enable time
W V
VI(VIN) = 3.3 V; CL = 0.1 F; RL = 500 .
Fig 18. Waveform showing the enable time
NX3P1108
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 9 January 2013
© NXP B.V. 2013. All rights reserved.
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