NXP Semiconductors
NX3P1108
Logic controlled high-side power switch
12.3 ON resistance test circuit and waveforms
VSW
VIH
EN
VIN
VI
RON = VSW / ILOAD.
Fig 12. Test circuit for measuring ON resistance
VOUT
GND
ILOAD
001aao350
521
Pȍ
DDD
521
Pȍ
DDD
7DPE &
ILOAD = 200 mA.
(1) VI(VIN) = 0.9 V.
(2) VI(VIN) = 1.2 V.
(3) VI(VIN) = 3.3 V.
(4) VI(VIN) = 3.6 V.
Fig 13. Waveform showing the ON resistance versus
temperature
9,9,1 9
VI(EN) = VI(VIN); ILOAD = 200 mA
(1) Tamb = 40 C.
(2) Tamb = 25 C.
(3) Tamb = 85 C.
Fig 14. Waveform showing the ON resistance versus
input voltage
NX3P1108
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 9 January 2013
© NXP B.V. 2013. All rights reserved.
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