MAL202138229E3 查看數據表（PDF） - Vishay Semiconductors
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MAL202138229E3 Datasheet PDF : 10 Pages
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021 ASM
Vishay BCcomponents
Table 6
TEST PROCEDURES AND REQUIREMENTS
NAME OF TEST
TEST
REFERENCE
PROCEDURE
(quick reference)
REQUIREMENTS
Endurance
Useful life
IEC 60384-4 /
EN130300
subclause 4.13
CECC 30301
subclause 1.8.1
Tamb = 85 °C; UR applied;
case Ø D x L = 4.5 mm x 10 mm to
10 mm x 25 mm:
UR = 6.3 V to 25 V: 1000 h;
UR = 40 V to 100 V: 2000 h;
case Ø D x L = 10 mm x 30 m to
21 mm x 38 mm:
UR = 6.3 V to 100 V: 5000 h
Tamb = 105 °C; UR applied;
case Ø D x L = 10 mm x 30 mm to
21 mm x 38 mm: 2000 h
Tamb = 85 °C; UR and IR applied;
case Ø D x L = 4.5 mm x 10 mm to
10 mm x 25 mm: 2500 h;
case Ø D x L = 10 mm x 30 mm to
21 mm x 38 mm: 8000 h
UR 6.3 V; C/C: +15 % / -30 %
UR > 6.3 V; C/C: ± 15 %
tan 1.3 x spec. limit
Z 2 x spec. limit
IL5 spec. limit
C/C: ± 20 %
tan 1.6 x spec. limit
Z 2x spec. limit
IL5 spec. limit
UR 6.3 V; C/C: +45 % / -50 %
UR > 6.3 V;C/C: ± 45 %
tan 3 x spec. limit
Z 3 x spec. limit
IL5 spec. limit
no short or open circuit
total failure percentage: 1 %
Shelf life
(storage at
high temperature)
IEC 60384-4 /
EN130300
subclause 4.17
Tamb = 85 °C; no voltage applied;
500 h
After test: UR to be applied for 30 min,
24 h to 48 h before measurement
C/C, tan , Z:
for requirements
see “Endurance test” above
IL5 2 x spec. limit
Statements about product lifetime are based on calculations and internal testing. They should only be interpreted as estimations. Also due to external factors, the
lifetime in the field application may deviate from the calculated lifetime. In general, nothing stated herein shall be construed as a guarantee of durability.
Revision: 16-Sep-16
8
Document Number: 28325
For technical questions, contact: aluminumcaps1@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
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