CRCW2512200RFKEH 查看數據表（PDF） - Vishay Semiconductors

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CRCW2512200RFKEH

Standard Thick Film Chip Resistors

Vishay Semiconductors 

www.vishay.com

D/CRCW e3

Vishay

TESTS AND REQUIREMENTS

All executed tests are carried out in accordance with the

following specifications:

EN 60115-1, generic specification

EN 60115-8 (successor of EN 140400), sectional

specification

EN 140401-802, detail specification

IEC 60068-2-xx, test methods

The parameters stated in the Test Procedures and

Requirements table are based on the required tests and

permitted limits of EN 140401-802. The table presents only

the most important tests, for the full test schedule refer to

the documents listed above. However, some additional

tests and a number of improvements against those

minimum requirements have been included.

The testing also covers most of the requirements specified

by EIA/IS-703 and JIS-C-5201-1.

The tests are carried out under standard atmospheric

conditions in accordance with IEC 60068-1, 4.3, whereupon

the following values are applied:

Temperature: 15 °C to 35 °C

Relative humidity: 25 % to 75 %

Air pressure: 86 kPa to 106 kPa (860 mbar to 1060 mbar).

A climatic category LCT / UCT / 56 is applied, defined by the

lower category temperature (LCT), the upper category

temperature (UCT), and the duration of exposure in the

damp heat, steady state test (56 days). The components are

mounted for testing on boards in accordance with EN

60115-8, 2.4.2 unless otherwise specified.

TEST PROCEDURES AND REQUIREMENTS

EN

60115-1

CLAUSE

IEC

60082-2 (1)

TEST

METHOD

TEST

PROCEDURE

Stability for product types:

D/CRCW e3

REQUIREMENTS PERMISSIBLE

CHANGE (R)

STABILITY CLASS 1 STABILITY CLASS 2

OR BETTER

OR BETTER

1  to 10 M

4.5

-

Resistance

-

±1%

±5%

4.8

-

Temperature coefficient

At (20 / -55 / 20) °C and

(20 / 155 / 20) °C

± 100 ppm/K

± 200 ppm/K

U = P70 x R or U = Umax.

whichever is the less severe;

4.25.1

-

Endurance at 70 °C

1.5 h on; 0.5 h off

70 °C; 1000 h

± (1 % R + 0.05 ) ± (2 % R + 0.1 )

70 °C; 8000 h

± (2 % R + 0.1 )

± (4 % R + 0.1 )

4.25.3

-

Endurance at upper

category temperature

155 °C; 1000 h

± (1 % R + 0.05 ) ± (2 % R + 0.1 )

4.24

78 (Cab) Damp heat, steady state

(40 ± 2) °C; 56 days;

(93 ± 3) % RH

± (1 % R + 0.05 )

(85 ± 2) °C; (85 ± 5) % RH;

4.37

67 (Cy)

Damp heat, steady state,

accelerated

U = 0.1 x P85 x R  100 V;

± (1 % R + 0.05 ) ± (2 % R + 0.1 )

1000 h

4.23

-

Climatic sequence:

4.23.2

2 (Bb)

Dry heat

125 °C; 16 h

4.23.3

30 (Db)

Damp

55 °C; 24 h;  90 % RH; 1 cycle

4.23.4

4.23.5

1 (Ab)

13 (M)

Cold

Low air pressure

-55 °C; 2 h

8.5 kPa; 2 h; (25 ± 10) °C

± (1 % R + 0.05 ) ± (2 % R + 0.1 )

4.23.6

30 (Db)

Damp heat, cyclic

55 °C; 5 days;

> 90 % RH; 5 cycles

4.23.7

-

-

1 (Aa)

DC load

Cold

U = P70 x R  Umax.; 1 min

-55 °C; 2 h

± (0.25 % R + 0.05 ) ± (0.5 % R + 0.05 )

4.19

14 (Na)

Rapid change

of temperature

30 min. at -55 °C and 30 min. at 125 °C

1000 cycles

± (1 % R + 0.05 )

no visible damage

4.13

-

Short time overload

U = 2.5 x P70 x R  2 x Umax.;

whichever is the less severe; 5 s

± (2 % R + 0.05 )

Severity no. 4:

4.27

-

Single pulse high voltage

overload

U = 10 x P70 x R

or U = 2 x Umax.;

whichever is the less severe;

10 pulses 10 μs / 700 μs

± (1 % R + 0.05 )

no visible damage

Revision: 18-Jun-2018

7

Document Number: 20035

For technical questions, contact: thickfilmchip@vishay.com

THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT

ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000

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