CXD1913AQ 查看數據表（PDF） - Sony Semiconductor
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CXD1913AQ Datasheet PDF : 36 Pages
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CXD1913AQ
Electrical Characteristics
DC characteristics
(Ta = 0 to +70°C, Vss = 0V)
Item
Symbol Measurement conditionsConditions Min. Typ. Max. Unit Pins
Input high voltage VIH1
VDD = 5.0V ± 5%
VDD = 3.3V ± 5%
2.2
1.8
V ∗1
Input low voltage
VIL1
VDD = 5.0V ± 5%
VDD = 3.3V ± 5%
0.8
0.5
V ∗1
Input high voltage VIH2
VDD = 5.0V ± 5%
VDD = 3.3V ± 5%
2.4
1.8
V ∗2
Input low voltage
VIL2
VDD = 5.0V ± 5%
VDD = 3.3V ± 5%
0.8
0.5
V ∗2
Input high voltage VIH3
VDD = 5.0V ± 5%
VDD = 3.3V ± 5%
0.7VDD
V ∗3
Input low voltage
VIL3
VDD = 5.0V ± 5%
VDD = 3.3V ± 5%
0.3VDD V ∗3
Output high voltage VOH1
IOH = –2.4mA
VDD = 5.0V ± 5%
VDD = 3.3V ± 5%
VDD – 0.8
V ∗4
Output low voltage VOL1
IOL = 4.8mA
VDD = 5.0V ± 5%
VDD = 3.3V ± 5%
0.4
V ∗4
Output high voltage VOH2
IOH = –1.2mA
VDD = 5.0V ± 5%
VDD = 3.3V ± 5%
VDD – 0.8
V ∗5
Output low voltage VOL2
IOL = 2.4mA
VDD = 5.0V ± 5%
VDD = 3.3V ± 5%
0.4
V ∗5
Input leak current IIL1
VI = 0 to 5.25V
VDD = 5.0V ± 5%
VDD = 3.3V ± 5%
–10
10 µA ∗6
Input leak current IIL2
Supply current
IDD
VI = 0V
VDD = 5.0V ± 5%
VDD = 3.3V ± 5%
VDD = 5.0V ± 5%
VDD = 3.3V ± 5%
–40
–100 –240 µA ∗7
–12
–30 –75
70 ∗8
40 ∗8
mA
∗1 PD0 to 15, TD8 to 10, XTEST1 to 3, TRST, TDI, TCK, XCS/SA, XVRST, F1/XTEST4, XTEST, XRST, XIICEN
∗2 SYSCLK
∗3 SI/SDA, SCK/SCL
∗4 PDCLK, VSYNC, HSYNC, FID, SO
∗5 TDO, TD0 to 10
∗6 PD0 to 15, TD8 to 10, TCK, SI/SDA, SCK/SCL, F1/XTEST4, XRST, SYSCLK
∗7 XTEST1 to 3, TRST, TDI, TMS, XCS/SA, XVRST, XTEST, XIICEN
∗8 Not include analog current
–6–
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