TLE4309
Table 2
Absolute Maximum Ratings
Parameter
Symbol Limit Values
Min. Max.
Input
Voltage
Current
Output
VI
-42 45
II
–
–
Voltage
Current
Reference Input
VQ
-1
40
IQ
–
–
Voltage
VREF
-1
16
Current
IREF
-2
2
Pulse Width Modulation / Enable Input
Voltage
Current
Temperatures
VPWM
-40
40
IPWM
-1
1
Junction temperature Tj
Storage temperature
Tstg
ESD Susceptibility
-40 150
-50 150
ESD Resistivity
VESD,HBM -2
2
1) ESD susceptibility, HBM according to EIA/JESD 22-A114B
Unit
V
mA
V
mA
V
mA
V
mA
°C
°C
kV
Remarks
–
internally limited
–
internally limited
–
–
–
–
–
–
Human Body Model1)
Note: Stresses above the ones listed here may cause permanent damage to the device.
Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
Note: Integrated protection functions are designed to prevent IC destruction under fault
conditions described in the data sheet. Fault conditions are considered as
“outside” normal operating range. Protection functions are not designed for
continuous repetitive operation.
Datasheet
4
Rev. 1.0, 2007-03-20