ATF22V10B(1998) 查看數據表（PDF） - Atmel Corporation

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ATF22V10B
(Rev.:1998)

HighPerformance EE PLD

Atmel Corporation 

ATF22V10B

DC Characteristics

Symbol Parameter

Condition

Min

Typ

Max

IIL

Input or I/O

Low Leakage Current

0 ≤ VIN ≤

VIL (MAX)

IIH

Input or I/O

High Leakage Current

3.5 ≤ VIN ≤ VCC

-35

-100

10

B-7, -10

Com.

Ind., Mil.

85

120

85

140

Com.

ICC

Power Supply Current,

Standby

VCC = MAX,

VIN = MAX,

Outputs Open

B-15, -25

Ind., Mil.

BQ-15

Com.

65

90

65

115

35

55

Com.

BQL-20, -25

Ind., Mil.

5

10

5

15

B-7, -10

Com.

Ind., Mil.

90

120

90

145

ICC2

Clocked Power

Supply Current

VCC = MAX,

Outputs Open,

f = 15 MHz

B-15, -25

BQ-15

Com.

Ind., Mil.

Com.

65

90

65

120

40

60

Com.

BQL-20, -25

Ind., Mil.

20

50

20

70

IOS(1)

Output Short

Circuit Current

VOUT = 0.5V

-130

VIL

VIH

VOL

VOH

Notes:

Input Low Voltage

-0.5

0.8

Input High Voltage

2.0

VCC + 0.75

Output Low Voltage

VIN = VIH or VIL,

VCC = MIN

IOL = 16 mA

IOL = 12 mA

Com., Ind.

Mil.

0.5

0.5

Output High Voltage

VIN = VIH or VIL,

VCC = MIN

IOH = -4.0 mA

2.4

1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.

Units

µA

µA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

V

V

V

V

V

3

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