HS-1840RH 查看數據表（PDF） - Intersil
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HS-1840RH Datasheet PDF : 13 Pages
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Burn-In/Life Test Circuits
HS-1840RH
+VS
GND
F4
1
2
R3
4
5
6
7
8
9
10
11
12
13
14
R
28
27
-VS
26
R
25
24
23
22
21
20
19
18
F5
17
F1
16
F2
15
F3
+VS
GND
VR
1
2
R3
4
5
6
7
8
9
10
11
12
13
14
R
R
28
27
-VS
26
R
25
24
23
22
21
20
19
18
17
16
15
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
NOTES:
VS+ = +15.5V ±0.5V, VS- = -15.5V ±0.5V
R = 1kΩ ±5%
C1 = C2 = 0.01µF ±10%, 1 each per socket, minimum
D1 = D2 = 1N4002, 1 each per board, minimum
Input Signals: square wave, 50% duty cycle, 0V to 15V peak ±10%
F1 = 100kHz; F2 = F1/2; F3 = F1/4; F4 = F1/8; F5 = F1/16
STATIC BURN-IN TEST CIRCUIT
NOTES:
R = 1kΩ ±5%, 1/4W
C1 = C2 = 0.01µF minimum, 1 each per socket, minimum
VS+ = 15.5V ±0.5V, VS- = -15.5V ±0.5V, VR = 15.5 ±0.5V
NOTES:
1. The above test circuits are utilized for all package types.
2. The Dynamic Test Circuit is utilized for all life testing.
Irradiation Circuit
HS-1840RH 28 LEAD DIP
+15V
1
NC
2
NC
3
+1V
4
5
6
7
8
9
10
11
12
13
14
+5V
28
27
-15V
1KΩ
26
25
24
23
22
21
20
19
18
17
16
15
NOTE: All irradiation testing is performed in the 28 lead CerDIP package.
Spec Number 518022
8
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