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MC100LVE222FA 查看數據表(PDF) - ON Semiconductor

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MC100LVE222FA Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
CLK
RESET
Q
1/2Q
MC100LVE222
Figure 3. Timing Diagram
Table 3. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC/VCCO
VEE
VI
Iout
PECL Mode Power Supply
NECL Mode Power Supply
PECL Mode Input Voltage
NECL Mode Input Voltage
Output Current
VEE = 0 V
8 to 0
V
VCC or VCCO = 0 V
−8 to 0
V
VEE = 0 V
VI  (VCC or VCCO)
6 to 0
V
VCC or VCCO = 0 V VI  VEE
−6 to 0
V
Continuous
Surge
50
mA
100
mA
IBB
VBB Sink/Source
TA
Operating Temperature Range
±0.5
mA
−40 to +85
°C
Tstg
Storage Temperature Range
qJA
Thermal Resistance (Junction to Ambient) 0 LFPM
500 LFPM
52 LQFP
52 LQFP
−65 to +150
70
48
°C
°C/W
°C/W
qJC
Thermal Resistance (Junction to Case)
standard board
52 LQFP
TBD
°C/W
Tsol
Wave Solder
<2 to 3 sec @ 248°C
265
°C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
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