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74LVX238M(2001) 查看數據表(PDF) - STMicroelectronics

零件编号
产品描述 (功能)
生产厂家
74LVX238M
(Rev.:2001)
ST-Microelectronics
STMicroelectronics ST-Microelectronics
74LVX238M Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
74LVX238
CAPACITIVE CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
VCC
(V)
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
CIN Input Capacitance 3.3
4 10
10
10 pF
CPD Power Dissipation
Capacitance
3.3
fIN = 10MHz
34
pF
(note 1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC
TEST CIRCUIT
CL =15/50pF or equivalent (includes jig and probe capacitance)
RT = ZOUT of pulse generator (typically 50)
5/9

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