74HCT132PW 查看數據表（PDF） - NXP Semiconductors.
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74HCT132PW Datasheet PDF : 20 Pages
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NXP Semiconductors
12. Waveforms
74HC132; 74HCT132
Quad 2-input NAND Schmitt trigger
9,
Q$Q%LQSXW
*1'
92+
Q<RXWSXW
92/
90
W3+/
9<
W7+/
90
9;
W3/+
W7/+
Fig 5.
Measurement points are given in Table 8.
VOL and VOH are typical voltage output levels that occur with the output load.
Input to output propagation delays
DDL
Table 8. Measurement points
Type
Input
74HC132
74HCT132
VM
0.5VCC
1.3 V
Output
VM
0.5VCC
1.3 V
VX
0.1VCC
0.1VCC
VY
0.9VCC
0.9VCC
9,
QHJDWLYH
SXOVH
*1'
9,
SRVLWLYH
SXOVH
*1'
90
WI
WU
90
9,
*
57
W:
W:
9&&
'87
90
WU
WI
90
92
&/
DDK
Fig 6.
Test data is given in Table 9.
Definitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Test circuit for measuring switching times
74HC_HCT132
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 4 — 1 December 2015
© NXP Semiconductors N.V. 2015. All rights reserved.
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