RT9018A/B_12 查看數據表（PDF） - Richtek Technology
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RT9018A/B_12 Datasheet PDF : 2 Pages
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RT9018A/B
Purpose
The HTOL test is to demonstrate the quality or reliability of device subjects to the
specified conditions over an extended time period.
The ESD tests are used to classify the electrostatic discharge of microcircuits.
The latch-up test is used to check IC latch-up characteristics.
The environment tests are to ensure the process of assembly of this package type that
meets Richtek quality specifications.
Test Items and Conditions
Items
HTOL
Condition
Ta=125℃,
VIN=1.1*VIN_MAX
Readout Q’ty
1000 hours
77
Rejects
0
Reference
JESD22-A108
ESD
HBM
--
3/ VOLT
0
JESD22-A114
MM
--
3/ VOLT
0
JESD22-A115
CDM
--
3/ VOLT
0
JESD22-C101
Latch-up
I-TEST
--
9
0
JESD78A
V-TEST
Preconditioning MSL-3
Bake
125℃
24 hours
385
0
MSL-3 Soaking
30℃/ 60% RH
192 hours
385
0
Reflow
260 +0/-5℃
3 cycles
385
0
JESD22-A113
HTST
THT
TCT
PCT
uHAST
Ta=150℃
1000 hours 77
0
Ta=85℃, 85%RH
1000 hours 77
0
Ta=-65℃ ~ 150℃
500 cycles 77
0
Ta=121℃,100%RH,2ATM 168 hours
77
0
Ta=130℃, 85%RH
96 hours
77
0
JESD22-A103
JESD22-A101
JESD22-A104
JESD22-A102
JESD22-A118
NOTE: 1. Preconditioning MSL-3 test was done before HTST, THT, TCT, PCT and uHAST tests.
2. All assembly houses are Richtek qualified suppliers.
Summary
The test results can be applied to all of the products including a series of RT9018A/B.
Any questions or inquiries for regarding related products or service of Richtek, you
may contact us through our technical support center.
(http://www.Richtek.com/contact10.1.jsp)
www.richtek.com
RT9018A/B Jan. 2012
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