MAX412BEPA 查看數據表（PDF） - Maxim Integrated

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MAX412BEPA

Single/Dual/Quad, 28MHz, Low-Noise, Low-Voltage, Precision Op Amps

Maxim Integrated 

Single/Dual/Quad, 28MHz, Low-Noise,

Low-Voltage, Precision Op Amps

0.1µF

100kΩ

+VS

2kΩ

10Ω

D.U.T

+VS

-VS

MAX410

MAX412

MAX414

4.7µF

MAX410

-VS

100kΩ

24.9kΩ

0.1µF

2kΩ

22µF

TO SCOPE x1

RIN = 1MΩ

4.7µF

110kΩ

Figure 3. 0.1Hz to 10Hz Voltage Noise Test Circuit

100

80

60

40

20

0

0.01

0.1

1

10

100

FREQUENCY (Hz)

Figure 4. 0.1Hz to 10Hz Voltage Noise Test Circuit, Frequency

Response

circuit shown in Figure 3. Figure 4 shows the frequency

response of the circuit. The test time for the 0.1Hz to

10Hz noise measurement should be limited to 10 sec-

onds, which has the effect of adding a second zero to

the test circuit, providing increased attenuation for fre-

quencies below 0.1Hz.

Current Noise Testing

The current-noise density can be calculated, once the

value of the input-referred noise is determined, by

using the standard expression given below:

[ ] eno2 - (AVCL)2(4kT)(Rn +Rp)

in =

(Rn +Rp)(AVCL)

A / Hz

where:

Rn = Inverting input effective series resistance

Rp= Noninverting input effective series resistance

eno = Output voltage-noise density at the frequency of

interest (V/√Hz)

in = Input current-noise density at the frequency of

interest (A/√Hz)

AVCL = Closed-loop gain

T = Ambient temperature in Kelvin (K)

k = 1.38 x 10-23 J/K (Boltzman’s constant)

Rp and Rn include the resistances of the input driving

source(s), if any.

If the Quan Tech model 5173 is used, then the AVCL

terms in the numerator and denominator of the equation

given above should be eliminated because the Quan

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