HI-303/883
TABLE 2. A.C. ELECTRICAL PERFORMANCE SPECIFICATIONS
Device Tested at: +VSUPPLY = +15V, −VSUPPLY = −15V, GND = 0V, Unless Otherwise Specified.
PARAMETERS
SYMBOL
CONDITIONS
GROUP A
SUB-
TEMPERATURE
GROUPS
(oC)
MIN
Turn “ON” Time
tON
CL = 33pF,
RL = 300Ω
9
25
-
10, 11
55 to 125
-
Turn “OFF” Time
tOFF
CL = 33pF,
RL = 300Ω
9
25
-
10, 11
55 to 125
-
MAX
300
500
250
450
UNITS
ns
ns
ns
ns
TABLE 3. ELECTRICAL PERFORMANCE SPECIFICATIONS (NOTE 1)
Device Tested at: +VSUPPLY = +15V, −VSUPPLY = −15V, GND = 0V, Unused Pins are Grounded.
PARAMETERS
SYMBOL
CONDITIONS
NOTE
TEMPERATURE
(oC)
MIN
MAX UNITS
Switches Input
Capacitance
CIS (OFF) Measured Source to GND
1
25
-
28
pF
Driver Input Capacitance
CC1
VA = 0V
1
25
-
10
pF
CC2
VA = 15V
1
25
-
10
pF
Switch Output Capacitance
COS
Measured Drain to GND
1
25
-
28
pF
Off Isolation
VISO
f = 1MHz, VGEN = 1VP-P
1
25
40
-
dB
Cross Talk
VCT
f = 1MHz, VGEN = 1VP-P
1
25
40
-
dB
Charge Transfer
VCTE
VS = GND, CL + 0.01µF
1
25
-
15
mV
NOTE:
1. Parameters listed in Table 2 are controlled via design or process parameters and are not directly tested at final production. These parameters
are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon
data from multiple production runs which reflect lot to lot and within lot variation.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS (Tables 1 and 2)
Interim Electrical Parameters (Pre Burn-in)
1
Final Electrical Test Parameters
1 (Note 2), 2, 3, 9, 10, 11
Group A Test Requirements
1, 2, 3, 9, 10, 11
Groups C & D Endpoints
1
NOTE:
2. PDA applies to Subgroup 1 only.
3