HI-303/883 查看數據表（PDF） - Intersil
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HI-303/883 Datasheet PDF : 11 Pages
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Test Circuits
HI-303/883
S
VIN
IIN
+VCC
D
GND
-VCC
FIGURE 1. INPUT LEAKAGE CURRENT
VS
IS
VIN
+VCC
S
VD
GND
-VCC
FIGURE 3. IS (OFF)
S
VS
VIN
+VCC
D
ID
VD
GND
-VCC
FIGURE 2. ID (OFF)
+VCC
S
D
ID(ON)
VIN
V
GND
-VCC
FIGURE 4. ID (ON)
+VCC
I1
S
D
VIN
GND
I2
-VCC
FIGURE 5. SUPPLY CURRENTS
S
D
TO MEASUREMENT
0.01MF
CIRCUITRY WITH INPUT
RESISTANCE OF 1mΩ
DRIVER
OR GREATER
f = 1kHz
SQUARE WAVE IF PULSE TEST IS USED:
TR ≤ 20ms
TR, TF ≤ 20ms
VIN (DRIVER)
VCTE
DROOP CAUSED BY
DEVICE LEAKAGE
AND MEASUREMENT
CIRCUITRY
SWITCHING TRANSIENT
NOTE: VCTE may be a positive or negative value.
FIGURE 6. CHARGE TRANSFER ERROR
4
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