XWM2152CDT/V 查看數據表（PDF） - Wolfson Microelectronics plc
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XWM2152CDT/V Datasheet PDF : 13 Pages
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WM2152
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Test Conditions:
AVDD1 = AVDD2 = DVDD = 3.3V, fCLK = 30MHz, EXTREF = AGND, Mode=1, TA = TMIN to TMAX, unless otherwise stated.
PARAMETER
SYMBOL TEST CONDITIONS
MIN
Externally applied VRB
1.05
reference range
Externally applied differential
0.75
reference range (VRT-VRB)
Reference Input Resistance
(VRT to VRB)
Digital Inputs / Outputs
Input LOW level
VIL
Input HIGH level
VIH
Input current
0.8 x DVDD
High level output voltage
Low level output voltage
VOL
IOH=50µA
DVDD-0.4
VOH
IOL=-50µA
High Impedance Output Current
Rise/Fall time
CLOAD=10pF
Analog Control Inputs (EXTREF, CON1, CON2), Clock Input (CLK)
Input LOW level
VIL
Input HIGH level
VIH
0.8 x AVDD1
Input current
Power Supplies
AVDD2 supply current
IAA2
3.0
AVDD1 supply current
IAA1
DVDD supply current
IDD
Total supply current
ITOT
Total supply current in standby
ISB
mode
fCLK = 0MHz
Power consumption
Notes
1. Input amplitudes for all single tone dynamic tests are all -0.5dBFS.
2. Inputs for two-tone IMD are 4.4MHz and 4.5MHz, each at -7dBFS.
3. The internal reference voltage is not intended for use driving off-chip.
TYP
MAX
UNIT
1.3
V
1.05
V
9
kΩ
0.2 x DVDD
V
V
+/- 1
uA
V
0.4
V
±1
µA
5.5
ns
0.2 x AVDD1
V
V
+/- 1
uA
3.3
3.6
mA
35
mA
13
mA
48
66
mA
10
µA
168
220
mW
PP Rev 1.2 August 2001
5
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