HEF4555BP 查看數據表（PDF） - NXP Semiconductors.

零件编号

产品描述 (功能)

生产厂家

HEF4555BP

1-of-4 decoder/demultiplexer

NXP Semiconductors. 

NXP Semiconductors

HEF4555B

1-of-4 decoder/demultiplexer

tW

VI 90 %

negative

pulse

VM

10 %

0V

tf

VI

positive

pulse

tr

90 %

VM

10 %

0V

tW

VM

tr

tf

VM

VI

G

VDD

VO

DUT

VEXT

RT

CL

001aal115

Fig 5.

Test data is given in Table 10.

Definitions for test circuit:

Device Under Test (DUT);

RL = Load resistance;

CL = Load capacitance including jig and probe capacitance;

RT = Termination resistance should be equal to the output impedance Zo of the pulse generator;

VEXT = External voltage for measuring switching times.

Load circuitry for switching times

Table 10. Test data

Supply voltage Input

VI

5 V to 15 V

VDD

tr = tf

 20 ns

Load

CL

50 pF

VEXT

tPLH, tPHL

open

tTHL, tTLH

VDD

HEF4555B

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 5 — 18 November 2011

© NXP B.V. 2011. All rights reserved.

7 of 13

Share Link: