DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

LCX007CL 查看數據表(PDF) - Sony Semiconductor

零件编号
产品描述 (功能)
生产厂家
LCX007CL Datasheet PDF : 24 Pages
First Prev 21 22 23 24
LCX007CL
Reliability test conditions
Items
High temperature
operation
High temperature storage
High temperature & high
humidity storage
Temperature cycle
Vibration
Test conditions
Time
Ta = 70°C
HVDD = 15.7V
VVDD = 15.7V
250h
Ta = 85°C
250h
Ta = 40°C
95% RH
250h
Ta = –30 to +85°C
10cy
X, Y, Z, 1.5mm
20min. for each
10 to 55Hz (1min. reciprocation) direction
Panel appearance
and performance
after those tests must
conform with the
standards.
Anti-electrostatic discharge test results
Conditions: C = 200pF, Rs = 0
Result:
Breakdown
voltage
+
Up to 100V
101 to 200V
Pin 8
Pins except pin no.8 have the strength more than 200V.
– 21 –

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]