CD22102E 查看數據表（PDF） - Harris Semiconductor
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CD22102E Datasheet PDF : 12 Pages
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Test Circuits and Waveforms
CD22101, CD22102
VDD
1
2
VSS
3
4
5
6
7
8
9
10
11
12
VSS
VDD
IDD
24
23
22
21
20
19
18
17
16
15
14
13
FIGURE 1. QUIESCENT CURRENT TEST CIRCUIT
VDD
II
1
2
VSS
3
4
5
6
7
8
9
10
11
12
VSS
VDD
24
23
22
21
20
19
18
17
16
15
14
13
MEASURE INPUTS SEQUENTIALLY TO BOTH VDD AND VSS
CONNECT ALL UNUSED INPUTS TO EITHER VDD OR VSS
FIGURE 2. INPUT CURRENT TEST CIRCUIT
500µF
VDD
0.1µF
ID
CLK
Q1 2kΩ
CD4029
Q2
Q2
1
CLK
Q3 Q3
2
Q4
CL 3
4
5
CL
6
7
CL
8
9
CL
10
Q4
11
12
2kΩ
VSS
2kΩ
CLOSE SWITCH S AFTER APPLYING VDD
2kΩ
24
S
23
Q1
22
CL
21
20
19 CL
18
CL
17
16
CL
15
14
13
105
TA = 25oC
104
VDD = 15V
10V
10V
103
5V
102
10
102
CL = 50pF
CL = 15pF
103
104
105
106
107
SWITCHING FREQUENCY (Hz)
FIGURE 3. DYNAMIC POWER DISSIPATION TEST CIRCUIT FOR CD22101AND TYPICAL DYNAMIC POWER DISSIPATION AS A
FUNCTION OF SWITCHING FREQUENCY
4-200
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