FT8010 查看數據表（PDF） - ON Semiconductor
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FT8010 Datasheet PDF : 15 Pages
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Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
Condition
VCC Supply Voltage
VIN DC Input Voltage
/SR0, /SR1, TRIG, DSR
VOUT Output Voltage(4)
/RST1 HIGH or LOW
RST2 HIGH or LOW
/RST1, RST2, VCC=0
IIK DC Input Diode Current
VIN < 0 V
IOK DC Output Diode Current
VOUT < 0 V
VOUT > VCC
IOH/IOL DC Output Source/Sink Current
ICC DC VCC or Ground Current per Supply Pin
TSTG Storage Temperature Range
TJ Junction Temperature under Bias
TL Junction Lead Temperature, Soldering 10 Seconds
PD Power Dissipation
Human Body Model, JESD22-A114
ESD Electrostatic Discharge Capability
Charged Device Model, JESD22-C101
Note:
4. IO absolute maximum rating must be observed.
Min.
-0.5
-0.5
-0.5
-0.5
-0.5
-50
-65
Max.
7
7
7
Vcc+0.5
7
-50
-50
+50
+50
±100
+150
+150
+260
5
4
2
Unit
V
V
V
mA
mA
mA
mA
°C
°C
°C
mW
kV
© 2009 Fairchild Semiconductor Corporation
FT8010 • Rev. 1.0.8
6
www.fairchildsemi.com
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