LH28F004SUT-NC80 查看數據表（PDF） - Sharp Electronics
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LH28F004SUT-NC80 Datasheet PDF : 31 Pages
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LH28F004SU-NC
4M (512K × 8) Flash Memory
ELECTRICAL SPECIFICATIONS
Absolute Maximum Ratings*
Temperature under bias ......................... 0°C to +80°C
Storage temperature ......................... -65°C to +125°C
*WARNING: Stressing the device beyond the “Abso-
lute Maximum Ratings” may cause permanent dam-
age. These are stress ratings only. Operation beyond
the “Operating Conditions” is not recommended and
extended exposure beyond the “Operating Conditions”
may affect device reliability.
VCC = 5.0 V ±0.5 V Systems
SYMBOL
PARAMETER
MIN. MAX. UNITS TEST CONDITIONS NOTE
TA Operating Temperature, Commercial
0 70.0 °C Ambient Temperature 1
VCC VCC with Respect to GND
-0.2 7.0
V
2
VPP VPP Supply Voltage with Respect to GND -0.2 7.0
V
2
V
Voltage on any Pin (Except VCC, VPP)
with Respect to GND
-0.5 7.0
V
2
I
Current into any Non-Supply Pin
±30 mA
IOUT Output Short Circuit Current
100.0 mA
3
NOTES:
1. Operating temperature is for commercial product defined by this specification.
2. Minimum DC voltage is -0.5 V on input/output pins. During transitions, this level may undershoot to -2.0 V for periods < 20 ns.
Maximum DC voltage on input/output pins is VCC + 0.5 V which, during transitions, may overshoot to VCC + 2.0 V for periods < 20 ns.
3. Output shorted for no more than one second. No more than one output shorted at a time.
Capacitance
For 5.0 V Systems
SYMBOL
PARAMETER
TYP.
Capacitance Looking into an
Address/Control Pin
7
CIN
Capacitance Looking into an
Address/Control Pin A10
9
COUT Capacitance Looking into an Output Pin
9
CLOAD
Load Capacitance Driven by Outputs for
Timing Specifications
Equivalent Testing Load Circuit VCC ± 10%
NOTE:
1. Sampled, not 100% tested.
MAX. UNITS
TEST CONDITIONS
10
pF TA = 25°C, f = 1.0 MHz
NOTE
1
12
pF TA = 25°C, f = 1.0 MHz
1
12
pF TA = 25°C, f = 1.0 MHz
1
100 pF For VCC = 5.0 V ±0.5 V
1
2.5
ns 25 Ω transmission line delay
18
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