NUP1301U 查看數據表（PDF） - NXP Semiconductors.

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NUP1301U

Ultra low capacitance ESD protection array

NXP Semiconductors. 

Nexperia

NUP1301U

Ultra low capacitance ESD protection array

120

IPP

(%)

80

40

100 % IPP; 8 μs

001aaa630

e−t

50 % IPP; 20 μs

0

0

10

20

30

40

t (μs)

Fig 1. 8/20 s pulse waveform according to

IEC 61000-4-5

6. Thermal characteristics

IPP

100 %

90 %

001aaa631

10 %

tr = 0.7 ns to 1 ns

t

30 ns

60 ns

Fig 2. ESD pulse waveform according to

IEC 61000-4-2

Table 8. Thermal characteristics

Symbol Parameter

Per device

Rth(j-a)

thermal resistance from

junction to ambient

Rth(j-sp)

thermal resistance from

junction to solder point

Conditions

Min Typ Max

in free air

[1][2] -

-

625

-

-

300

[1] Single diode loaded.

[2] Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint.

Unit

K/W

K/W

NUP1301U

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 1 — 28 January 2011

© Nexperia B.V. 2017. All rights reserved

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