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MCH3477 查看數據表(PDF) - ON Semiconductor

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MCH3477 Datasheet PDF : 5 Pages
1 2 3 4 5
Electrical Characteristics at Ta 25C
Parameter
Symbol
Drain to Source Breakdown Voltage
Zero-Gate Voltage Drain Current
Gate to Source Leakage Current
Gate Threshold Voltage
Forward Transconductance
Static Drain to Source On-State Resistance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-ON Delay Time
Rise Time
Turn-OFF Delay Time
Fall Time
Total Gate Charge
Gate to Source Charge
Gate to Drain “Miller” Charge
Forward Diode Voltage
V(BR)DSS
IDSS
IGSS
VGS(th)
gFS
RDS(on)1
RDS(on)2
RDS(on)3
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
Qg
Qgs
Qgd
VSD
MCH3477
Conditions
ID=1mA, VGS=0V
VDS=20V, VGS=0V
VGS=±8V, VDS=0V
VDS=10V, ID=1mA
VDS=10V, ID=2A
ID=2A, VGS=4.5V
ID=1A, VGS=2.5V
ID=0.5A, VGS=1.8V
VDS=10V, f=1MHz
See specified Test Circuit
VDS=10V, VGS=4.5V, ID=4.5A
IS=4.5A, VGS=0V
min
20
Value
typ
0.4
2.0
3.4
29
43
69
410
84
59
7.5
26
38
32
5.1
0.7
1.7
0.78
Unit
max
V
1 A
10 A
1.3
V
S
38 m
61 m
99 m
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
1.2
V
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be
indicated by the Electrical Characteristics if operated under different conditions.
Switching Time Test Circuit
VIN
4.5V
0V
VIN
PW=10s
D.C.1%
G
VDD=10V
ID=2A
RL=5
D
VOUT
P.G
50
MCH3477
S
www.onsemi.com
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