854110AKILF 查看數據表（PDF） - Integrated Device Technology

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854110AKILF

2.5V Differential LVDS Clock Buffer

Integrated Device Technology 

ICS854110I Data Sheet

2.5V DIFFERENTIAL LVDS CLOCK BUFFER

Symbol Parameter

tR / tF

Output Rise/ Fall Time;

30% to 70%

Test Conditions

RSET = 4kΩ

RSET = 15kΩ

RSET = 50kΩ

RSET = 150kΩ

Minimum

100

600

650

800

Typical

300

1030

1160

1540

Maximum

500

1600

1850

2200

Units

ps

ps

ps

ps

NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is

mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium

has been reached under these conditions.

NOTE 1: Measured from the differential input crossing point to the differential output crossing point.

NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at the differential cross

points.

NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.

NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltage, same frequency, same temperature and

with equal load conditions. Using the same type of inputs on each device, the outputs are measured at the differential cross points.

NOTE 5: Input Duty Cycle must be 50%.

ICS854110AKI REVISION B JANUARY 27, 2011

6

©2011 Integrated Device Technology, Inc.

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