SPT7937SIR 查看數據表（PDF） - Cadeka Microcircuits LLC.
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SPT7937SIR Datasheet PDF : 11 Pages
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ELECTRICAL SPECIFICATIONS
TA=TMIN to TMAX, VDD=+5.0 V, ƒS=28 MSPS, VIN=0 to 4 V, VRHS=4.0 V, VRLS=0.0 V, unless otherwise specified.
PARAMETERS
TEST
CONDITIONS
TEST
LEVEL
MIN
SPT7937
TYP
Dynamic Performance
Signal-to-Noise Ratio
(without Harmonics)
ƒIN = 3.58 MHz
ƒIN = 10 MHz
Harmonic Distortion
ƒIN = 3.58 MHz
ƒIN = 10 MHz
Signal-to-Noise and Distortion
(SINAD)
ƒIN = 3.58 MHz
ƒIN = 10 MHz
Spurious Free Dynamic Range
ƒIN = 10 MHz
Differential Phase
Differential Gain
V
65
VI
61
63
V
–73
VI
–72
V
64
VI
60
62
V
73
V
0.6
V
0.5
Inputs
Logic 1 Voltage
Logic 0 Voltage
Maximum Input Current Low
Maximum Input Current High
Input Capacitance
VI
2.0
VI
VI
–10
VI
–10
V
5
Digital Outputs
Logic 1 Voltage
Logic 0 Voltage
CLK to Output Delay Time (tD)
Power Supply Requirements
Voltages
OVDD
VDD
Currents
IDD
Power Dissipation
Power Supply Rejection Ratio
IOH = 0.5 mA
IOL = 1.6 mA
VI
VDD – 0.5
VI
IV
15
IV
3.0
IV
4.75
5.0
VI
34
VI
170
V
60
MAX UNITS
dB
dB
dB
–63.5 dB
dB
dB
dB
Degree
%
V
0.8
V
+10 µA
+10 µA
pF
V
0.4
V
ns
5.0
V
5.25 V
40
mA
200 mW
dB
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characteri-
zation data.
Parameter is a typical value for information purposes only.
100% production tested at TA = +25 °C. Parameter is guaranteed
over specified temperature range.
SPT7937
3
3/5/02
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