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DS1780E 查看數據表(PDF) - Maxim Integrated

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DS1780E
MaximIC
Maxim Integrated MaximIC
DS1780E Datasheet PDF : 28 Pages
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DS1780
Note: To properly implement the NAND TREE test on the PCB, no pins listed in the tree should be
connected directly to power or ground; if a pin is needed to configure as a permanent low such as an
address, it should be connected to ground through a low value resister such as 330 (to allow the ATE
(Automatic Test Equipment) to drive it high.
DS1780 NAND TREE TEST FLOW Figure 7
DS1780 REGISTERS AND RAM
INTERNAL ADDRESS REGISTER Table 10.0
BIT
NAME
R/W
DESCRIPTION
<7:0> Address Pointer W Address of RAM and Registers. See the tables below for detail.
ADDRESS POINTER (POWER ON DEFAULT 00h) Table 10.1
REGISTERS AND RAM
<A7:A0>
(HEX)
POWER ON VALUE OF REGISTERS:
<7:0> (BINARY)
Configuration Register
40h
0000 1000
Interrupt INT Status Register 1
41h
0000 0000
Interrupt INT Status Register 2
42h
0000 0000
INT Mask Register 1
43h
0000 0000
INT Mask Register 2
44h
0000 0000
Chassis Intrusion Clear Register
46h
0000 0000
VID Register
47h
<7:4> = 0101, <3:0> = VID3 - VID0
Serial Address Register
48h
0010 1101
VID 4 Register
49h
<7:1> = 1000 000, <0>=VID 4
Temperature Configuration Register 4Bh
0000 0001
Test Register
15h
0000 0000
Analog Output
19h
1111 1111
Value RAM
20h-3Dh
Company ID
3Eh
1101 1010
Stepping
3Fh
0000 0001
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