MC100LVEP210MNG 查看數據表（PDF） - ON Semiconductor
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MC100LVEP210MNG Datasheet PDF : 9 Pages
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MC100LVEP210
Table 2. ATTRIBUTES
Characteristics
Internal Input Pulldown Resistor
Internal Input Pull−up Resistor
ESD Protection
Human Body Model
Machine Model
Charged Device Model
Moisture Sensitivity (Note 1)
LQFP−32
QFN−32
Flammability Rating
Oxygen Index: 28 to 34
Transistor Count
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. For additional information, see Application Note AND8003/D.
Value
75 kW
37.5 kW
> 2 kV
> 100 V
> 2 kV
Pb Pkg
Pb−Free Pkg
Level 2
N/A
Level 2
Level 1
UL 94 V−0 @ 0.125 in
461 Devices
Table 3. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
PECL Mode Power Supply
VEE
NECL Mode Power Supply
VI
PECL Mode Input Voltage
NECL Mode Input Voltage
Iout
Output Current
VEE = 0 V
VCC = 0 V
VEE = 0 V
VCC = 0 V
Continuous
Surge
VI ≤ VCC
VI ≥ VEE
6
V
−6
V
6
V
−6
V
50
mA
100
mA
IBB
VBB Sink/Source
TA
Operating Temperature Range
Tstg
Storage Temperature Range
qJA
Thermal Resistance (Junction−to−Ambient) 0 lfpm
500 lfpm
LQFP−32
LQFP−32
± 0.5
−40 to +85
−65 to +150
80
55
mA
°C
°C
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
Standard Board
qJA
Thermal Resistance (Junction−to−Ambient) 0 lfpm
500 lfpm
LQFP−32
QFN−32
QFN−32
12 to 17
31
27
°C/W
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
2S2P
QFN−32
Tsol
Wave Solder
Pb <2 to 3 sec @ 248°C
Pb−Free <2 to 3 sec @ 260°C
12
°C/W
265
°C
265
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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