MC100LVEP210MNG 查看數據表（PDF） - ON Semiconductor
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MC100LVEP210MNG Datasheet PDF : 9 Pages
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MC100LVEP210
Table 8. AC CHARACTERISTICS VCC = 0 V; VEE = −2.375 to −3.8 V or VCC = 2.375 to 3.8 V; VEE = 0 V (Note 13)
−40°C
25°C
85°C
Symbol
fmaxPECL/
HSTL
tPLH/tPHL
Characteristic
Maximum Frequency (Figure 4)
Propagation Delay @ 2.5 V
Propagation Delay @ 3.3 V
Min Typ Max Min Typ Max Min Typ Max Unit
3
3
3
GHz
220 300 380 270 350 430 300 400 500 ps
220 300 380 270 350 430 330 410 490
tskew
Within−Device Skew (Note 14)
Device−to−Device Skew (Note 15)
20 25
85 160
20 25
85 160
20 35 ps
85 160
tJITTER
CLOCK Random Jitter (RMS)
@ v0.5 GHz
@ v1.0 GHz
@ v1.5 GHz
@ v2.0 GHz
@ v2.5 GHz
@ v3.0 GHz
0.184 0.3
0.190 0.3
0.178 0.3
0.196 0.3
0.239 0.4
0.336 0.5
0.207 0.3
0.200 0.3
0.197 0.3
0.233 0.4
0.301 0.4
0.422 0.5
ps
0.271 0.4
0.252 0.4
0.259 0.4
0.308 0.5
0.399 0.5
0.572 0.9
VPP
Minimum Input Swing
150 800 1200 150 800 1200 150 800 1200 mV
tr/tf
Output Rise/Fall Time (20%−80%)
100 170 250 120 190 270 150 280 350 ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
13. Measured with 750 mV source, 50% duty cycle clock source. All loading with 50 W to VCC − 2.0 V.
14. Skew is measured between outputs under identical transitions of similar paths through a device.
15. Device−to−Device skew for identical transitions at identical VCC levels.
800
700
600
500
400
300
200
100
0
0
1000
2000
3000
4000
FREQUENCY (MHz)
Figure 4. Fmax Typical
5000
6000
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