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ATC100B5R6CT500XT 查看數據表(PDF) - NXP Semiconductors.

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ATC100B5R6CT500XT
NXP
NXP Semiconductors. NXP
ATC100B5R6CT500XT Datasheet PDF : 28 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Table 1. Maximum Ratings
Rating
Drain - Source Voltage
Gate - Source Voltage
Storage Temperature Range
Case Operating Temperature
Operating Junction Temperature (1,2)
Input Power
Table 2. Thermal Characteristics
Characteristic
Thermal Resistance, Junction to Case
Symbol
VDSS
VGS
Tstg
TC
TJ
Pin
Symbol
RθJC
Value
- 0.5, +68
- 0.5, +6
- 65 to +150
150
225
20
Value (2,3)
Unit
Vdc
Vdc
°C
°C
°C
dBm
Unit
°C/W
Final Application
Stage 1, 26 Vdc, IDQ1 = 100 mA
4.3
(Pout = 15 W CW)
Stage 2, 26 Vdc, IDQ2 = 170 mA
1.2
Driver Application
Stage 1, 26 Vdc, IDQ1 = 130 mA
4.3
(Pout = 3 W CW)
Stage 2, 26 Vdc, IDQ2 = 170 mA
1.3
Table 3. ESD Protection Characteristics
Test Methodology
Class
Human Body Model (per JESD22 - A114)
1A (Minimum)
Machine Model (per EIA/JESD22 - A115)
A (Minimum)
Charge Device Model (per JESD22 - C101)
III (Minimum)
Table 4. Moisture Sensitivity Level
Test Methodology
Rating
Package Peak Temperature
Unit
Per JESD 22 - A113, IPC/JEDEC J - STD - 020
3
260
°C
Table 5. Electrical Characteristics (TC = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
Functional Tests (In Freescale 1930 - 1990 MHz Test Fixture, 50 ohm system) VDD = 26 Vdc, IDQ1 = 100 mA, IDQ2 = 170 mA, Pout = 15 W
PEP, f1 = 1930 MHz, f2 = 1930.1 MHz, Two - Tone CW
Power Gain
Gps
24
26
dB
Power Added Efficiency
PAE
26
28
%
Intermodulation Distortion
IMD
- 30
- 27
dBc
Input Return Loss
IRL
- 10
dB
Typical Two - Tone Performances (In Freescale Test Fixture, 50 ohm system) VDD = 26 Vdc, IDQ1 = 100 mA, IDQ2 = 170 mA, Pout =
15 W PEP, 1805 - 1880 MHz, Two - Tone CW, 100 kHz Tone Spacing
Power Gain
Gps
26
dB
Power Added Efficiency
PAE
28
%
Intermodulation Distortion
IMD
- 30
dBc
Input Return Loss
IRL
- 10
dB
1. Continuous use at maximum temperature will affect MTTF.
2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access
MTTF calculators by product.
3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes - AN1955.
(continued)
MW6IC2015NBR1 MW6IC2015GNBR1
2
RF Device Data
Freescale Semiconductor

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